Journal Articles RWTH 2022

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http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article (Review Article)  ;  ;  ;  ;  ;  ;
Endurance of 2 Mbit Based BEOL Integrated ReRAM
IEEE access 10, 122696-122705 () [10.1109/ACCESS.2022.3223657]  GO DBCoverage  Volltext herunterladen Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article (Letter)  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;
Effect of electron conduction on the read noise characteristics in ReRAM devices
APL materials 10(10), 101114 () [10.1063/5.0109787]  GO OpenAccess  Volltext herunterladen Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Dissertation / PhD Thesis  ;  ;
Flexible two‑dimensional/three‑dimensional material based photodetectors
Aachen : RWTH Aachen University 1 Online-Ressource : Illustrationen, Diagramme () [10.18154/RWTH-2022-09676] = Dissertation, Rheinisch-Westfälische Technische Hochschule Aachen, 2021  GO OpenAccess  Volltext herunterladen Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;
Scaling and Confinement in Ultrathin Chalcogenide Films as Exemplified by GeTe
Small : nano micro 18(21), 2201753 () [10.1002/smll.202201753]  GO OpenAccess  Volltext herunterladen Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;
2D materials for future heterogeneous electronics
Nature Communications 13, 1392 () [10.1038/s41467-022-29001-4]  GO OpenAccess  Volltext herunterladen Files BibTeX | EndNote: XML, Text | RIS

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Zero‐Bias Power‐Detector Circuits based on MoS$_{2}$ Field‐Effect Transistors on Wafer‐Scale Flexible Substrates
Advanced materials 2108469 () [10.1002/adma.202108469]  GO OpenAccess  Volltext herunterladen Files BibTeX | EndNote: XML, Text | RIS

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A Survey of Neuromorphic Computing-in-Memory: Architectures, Simulators, and Security
IEEE design & test 39(2), 90-99 () [10.1109/MDAT.2021.3102013]  GO BibTeX | EndNote: XML, Text | RIS

Letzte Änderung: 18.03.2022